Published April 1989 | Version v1
Journal article

Flexible megavolt system for ion implantation and ion beam analysis

  • 1. High Voltage Engineering Europa BV, Amersfoort (Netherlands)

Description

Megavolt ion beams have proven to be of interest for ion beam analysis as well as for ion implantation. Recently High Voltage Engineering Europa B.V. developed highly flexible megavolt systems suitable for both techniques. The heart of the system is a single-ended accelerator equipped with a unique ion source exchange system capable of handling four kinds of ion sources, mass separation at high voltage level and an X-ray intensity suppression system. The accelerator is able to produce a large variety of continuous homogeneous and highly collimated mass-analyzed ions beams of from several to a hundred μA in the energy range of 50 keV upto 1 MeV (1 MV model) or 100 keV up to 2 MeV (2 MV model) using singly charged ions, whereby the maximum energy can be easily reached and maintained without conditioning. Combined with two dedicated end stations (one for ion beam analysis using RBS, channeling, NRA and PIXE and one with automatic wafer handling system for both single wafer implantation and batch processing) this system is suitable for research as well as industrial applications. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research, Section B
Journal Volume
40/41
Journal Issue
pt.1
Series
Nucl. Instrum. Methods Phys. Res., Sect. B.
Journal Page Range
522-525
ISSN
0168-583X
CODEN
NIMBE

Conference

Title
10. conference on the application of accelerators in research and industry.
Dates
7-9 Nov 1988.
Place
Denton, TX (USA).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
20075573
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AUTOMATION; ION BEAMS; ION IMPLANTATION; ION SOURCES; KEV RANGE 100-1000; LINEAR ACCELERATORS; MEV RANGE 01-10; PERFORMANCE; PIXE ANALYSIS; SILICON
Descriptors DEC
ACCELERATORS; BEAMS; CHEMICAL ANALYSIS; ELEMENTS; ENERGY RANGE; KEV RANGE; MEV RANGE; NONDESTRUCTIVE ANALYSIS; SEMIMETALS; X-RAY EMISSION ANALYSIS