Modulation transfer function and detective quantum efficiency of electron bombarded charge coupled device detector for low energy electrons
Creators
- 1. Institute of Scientific Instruments, Academy of Sciences of the Czech Republic, Kralovopolska 147, CZ-61264 Brno (Czech Republic)
Description
The use of a thinned back-side illuminated charge coupled device chip as two-dimensional sensor working in direct electron bombarded mode at optimum energy of the incident signal electrons is demonstrated and the measurements of the modulation transfer function (MTF) and detective quantum efficiency (DQE) are described. The MTF was measured for energy of electrons 4 keV using an edge projection method and a stripe projection method. The decrease of the MTF for a maximum spatial frequency of 20.8 cycles/mm, corresponding to the pixel size 24x24 μm, is 0.75≅-2.5 dB, and it is approximately the same for both horizontal and vertical directions. DQE was measured using an empty image and the mixing factor method. Empty images were acquired for energies of electrons from 2 to 5 keV and for various doses, ranging from nearly dark image to a nearly saturated one. DQE increases with increasing energy of bombarded electrons and reaches 0.92 for electron energy of 5 keV. For this energy the detector will be used for the angle- and energy-selective detection of signal electrons in the scanning low energy electron microscope
Additional details
Identifiers
- DOI
- 10.1063/1.2018587;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 76
- Journal Issue
- 9
- Journal Page Range
- p. 093704-093704.6
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37035634
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHARGE-COUPLED DEVICES; ELECTRON DETECTION; ELECTRON MICROSCOPES; ELECTRONS; IMAGES; KEV RANGE 01-10; MODULATION; QUANTUM EFFICIENCY; RADIATION DETECTORS; SCANNING ELECTRON MICROSCOPY; SIGNALS; TRANSFER FUNCTIONS
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; EFFICIENCY; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; FUNCTIONS; KEV RANGE; LEPTONS; MEASURING INSTRUMENTS; MICROSCOPES; MICROSCOPY; RADIATION DETECTION; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- (c) 2005 American Institute of Physics