Temperature dependence of contact resistance at metal/MWNT interface
- 1. Materials Research Center, Samsung Advanced Institute of Technology, Samsung Electronics, Suwon 443-803 (Korea, Republic of)
Description
Although contact resistance of carbon nanotube (CNT) is one of the most important factors for practical application of electronic devices, a study regarding temperature dependence on contact resistance of CNTs with metal electrodes has not been found. Here, we report an investigation of contact resistance at multiwalled nanotube (MWNT)/Ag interface as a function of temperature, using MWNT/polydimethylsiloxane (PDMS) composite. Electrical resistance of MWNT/PDMS composite revealed negative temperature coefficient (NTC). Excluding the contact resistance with Ag electrode, the NTC effect became less pronounced, showing lower intrinsic resistivity with the activation energy of 0.019 eV. Activation energy of the contact resistance of MWNT/Ag interface was determined to be 0.04 eV, two times larger than that of MWNT-MWNT network. The increase in the thermal fluctuation assisted electron tunneling is attributed to conductivity enhancement at both MWNT/MWNT and MWNT/Ag interfaces with increasing temperature.
Additional details
Identifiers
- DOI
- 10.1063/1.4958840;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 109
- Journal Issue
- 2
- Journal Page Range
- vp.
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48035143
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ACTIVATION ENERGY; CARBON NANOTUBES; ELECTRIC CONDUCTIVITY; ELECTRODES; ELECTRONIC EQUIPMENT; INTERFACES; METALS; TEMPERATURE COEFFICIENT; TEMPERATURE DEPENDENCE
- Descriptors DEC
- CARBON; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY; EQUIPMENT; NANOSTRUCTURES; NANOTUBES; NONMETALS; PHYSICAL PROPERTIES; REACTIVITY COEFFICIENTS
Optional Information
- Notes
- (c) 2016 Author(s)