Published April 11, 2002
| Version v1
Journal article
Application of multiparameter coincidence spectrometry using a Ge detectors array to neutron activation analysis
Description
The method of multiparameter coincidence spectrometry based on γ-γ coincidence is widely used for the nuclear structure studies, because of its high sensitivity to γ-rays. In this study, feasibility of the method of multiparameter coincidence spectrometry for analytical chemistry was examined. Two reference igneous rock samples (JP-1, JB-1a) issued by the Geological Survey of Japan were irradiated at a research reactor, and the γ-rays from the radioisotopes produced via neutron capture reactions were measured using an array of 12 Ge detectors with BGO Compton suppressors, GEMINI. Simultaneously 24 elements were analyzed without chemical separation. The observed smallest component was Eu contained in JP-1 with abundance of 4 ppb
Additional details
Identifiers
- PII
- S0168900201015108;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 482
- Journal Issue
- 1-2
- Journal Page Range
- p. 328-333
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34002551
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BGO DETECTORS; CAPTURE; COINCIDENCE SPECTROMETRY; GAMMA DETECTION; GE SEMICONDUCTOR DETECTORS; IGNEOUS ROCKS; IRRADIATION; NEUTRON ACTIVATION ANALYSIS; NEUTRON REACTIONS; RESEARCH REACTORS; SENSITIVITY
- Descriptors DEC
- ACTIVATION ANALYSIS; BARYON REACTIONS; CHEMICAL ANALYSIS; COINCIDENCE METHODS; COUNTING TECHNIQUES; DETECTION; HADRON REACTIONS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; NUCLEAR REACTIONS; NUCLEON REACTIONS; RADIATION DETECTION; RADIATION DETECTORS; REACTORS; RESEARCH AND TEST REACTORS; ROCKS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SOLID SCINTILLATION DETECTORS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.