Design optimization of an emittance measurement system at Pitz
- 1. DESY Zeuthen (Germany)
Description
The photo injector test facility at DESY Zeuthen (PITZ) has been built to test and to optimize electron sources for Free Electron Lasers (FELs). In order to study the emittance conservation principle, further acceleration is required. To increase the electron beam energy up to 30 MeV, a booster accelerating cavity is under commissioning. With this upgrade, the projected normalized transverse emittance less than 1 mm mrad is expected from beam dynamics simulations. To measure such small emittance, an upgrade of the existing Emittance Measurement SYstem (EMSY) is required. EMSY uses the slit mask technique to determine the beam emittance. In this paper, considerations on the physics of the system as well as results from GEANT4 simulations are given. The expected signal to noise ratio, the resolution of the system, and the energy deposition in the slit-mask are presented. EMSY is under construction at INRNE Sofia. Installation and first results are expected by the end of this year. (author)
Additional details
Publishing Information
- Imprint Title
- DIPAC 2005 7. European workshop on beam diagnostics and instrumentation for particle accelerators
- Imprint Pagination
- 415 p.
- Journal Page Range
- p. 302-304
- Report number
- INIS-FR--6358
Conference
- Title
- DIPAC 2005 7. European workshop on beam diagnostics and instrumentation for particle accelerators
- Dates
- 6-8 Jun 2005
- Place
- Lyon (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 38074202
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM DYNAMICS; BEAM EMITTANCE; BEAM MONITORS; BEAM OPTICS; COMPUTERIZED SIMULATION; ELECTRON BEAMS; ENERGY ABSORPTION; G CODES; OPTIMIZATION
- Descriptors DEC
- ABSORPTION; BEAMS; COMPUTER CODES; DYNAMICS; LEPTON BEAMS; MEASURING INSTRUMENTS; MECHANICS; MONITORS; PARTICLE BEAMS; SIMULATION; SORPTION
Optional Information
- Notes
- 5 refs.