An electron beam ion source for laboratory experiments
Creators
- 1. Nuclear Science and Engineering Program, Ward Laboratory, Cornell University, Ithaca, New York 14853 (United States)
Description
The design and properties of an electron beam ion source (EBIS) capable of producing low-energy, highly charged ions such as Ar16+ and Xe30+ are described. The source, to be used in laboratory experiments in atomic and surface physics, utilizes a conventional, 0.42-T solenoid and an externally launched electron beam. Ultrahigh vacuum in the ionization region is created by a distributed sputter-ion pump. The source design is relatively simple, and the source is small and easy to operate. The concept of a saturated electron beam is introduced in order to explain the observed argon and xenon ion charge state evolution. Very high ion charge states can be produced by confining ions for times up to 1 s in an electron beam in which the degree of space-charge neutralization by ions is determined by potentials applied to the drift tubes
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 63
- Journal Issue
- 6
- Series
- Rev. Sci. Instrum.
- Journal Page Range
- 3399-3411
- ISSN
- 0034-6748
- CODEN
- RSINA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23084194
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ARGON IONS; BEAM NEUTRALIZATION; DESIGN; DRIFT TUBES; ELECTRON BEAMS; ION SOURCES; SPUTTERING; XENON IONS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; IONS; LEPTON BEAMS; PARTICLE BEAMS