Published June 1992 | Version v1
Journal article

An electron beam ion source for laboratory experiments

  • 1. Nuclear Science and Engineering Program, Ward Laboratory, Cornell University, Ithaca, New York 14853 (United States)

Description

The design and properties of an electron beam ion source (EBIS) capable of producing low-energy, highly charged ions such as Ar16+ and Xe30+ are described. The source, to be used in laboratory experiments in atomic and surface physics, utilizes a conventional, 0.42-T solenoid and an externally launched electron beam. Ultrahigh vacuum in the ionization region is created by a distributed sputter-ion pump. The source design is relatively simple, and the source is small and easy to operate. The concept of a saturated electron beam is introduced in order to explain the observed argon and xenon ion charge state evolution. Very high ion charge states can be produced by confining ions for times up to 1 s in an electron beam in which the degree of space-charge neutralization by ions is determined by potentials applied to the drift tubes

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
63
Journal Issue
6
Series
Rev. Sci. Instrum.
Journal Page Range
3399-3411
ISSN
0034-6748
CODEN
RSINA

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23084194
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ARGON IONS; BEAM NEUTRALIZATION; DESIGN; DRIFT TUBES; ELECTRON BEAMS; ION SOURCES; SPUTTERING; XENON IONS
Descriptors DEC
BEAMS; CHARGED PARTICLES; IONS; LEPTON BEAMS; PARTICLE BEAMS