Published October 2008
| Version v1
Journal article
Microstructure of 5 keV gold-implanted polydimethylsiloxane
- 1. Ecole Polytechnique Federale de Lausanne (EPFL), Microsystems for Space Technologies Laboratory (LMTS), Rue Jaquet-Droz 1, Case Postale 526, CH-2002 Neuchatel (Switzerland)
- 2. Institute of Microtechnology, University of Neuchatel, Neuchatel (Switzerland)
Description
The first high-resolution transmission electron microscopy (TEM) cross-section images of flexible electrodes fabricated by gold ion implantation at 5 keV into polydimethylsiloxane (PDMS) are presented. A TEM sample preparation method based on cryoultramicrotomy, adapted for extremely low-modulus (1 MPa) elastomers, was developed, allowing the gold nanoparticles in a PDMS matrix to be imaged. The cluster size, size distribution and implantation depth of 50 nm were determined from the images and used to calculate the Young's modulus of the implanted layer
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2008.06.038Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2008.06.038;
- PII
- S1359-6462(08)00486-7;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 59
- Journal Issue
- 8
- Journal Page Range
- p. 893-896
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40027695
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPOSITE MATERIALS; CROSS SECTIONS; ELASTICITY; ELASTOMERS; GOLD; GOLD IONS; ION IMPLANTATION; KEV RANGE; LAYERS; MATRIX MATERIALS; MICROSTRUCTURE; NANOSTRUCTURES; PRESSURE RANGE MEGA PA 01-10; SAMPLE PREPARATION; TRANSMISSION ELECTRON MICROSCOPY; YOUNG MODULUS
- Descriptors DEC
- CHARGED PARTICLES; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; IONS; MATERIALS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; POLYMERS; PRESSURE RANGE; PRESSURE RANGE MEGA PA; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.