Published November 15, 2006 | Version v1
Journal article

Neutron and X-ray reflectivity studies on DNA adsorption on mixed DPPC/DC-Cholesterol monolayers

  • 1. Department of Engineering and System Science, National Tsing Hua University, Hsinchu 300, Taiwan (China)
  • 2. National Synchrotron Radiation Research Center, Hsinchu 300, Taiwan (China)
  • 3. Paul Scherrer Institut, CH-5232 Villigen-PSI (Switzerland)

Description

We have studied DNA adsorption on mixed DPPC/DC-Chol monolayers. Solid supported mixed monolayers on silicon wafers were prepared using Langmuir-Blodgett (LB) dipping technique. Neutron and X-ray reflectivity measurements were used to characterize these LB monofilms. For LB monofilms with DNA adsorption, the reflectivity data of the DPPC/DNA film are very close to that from the DPPC film, which indicates only minor DNA adsorption on the pure DPPC monolayer. Increasing the percentage of DC-Chol, film thickness increases. The DC-Chol/DNA film is thicker than the pure DC-Chol film (film thickness 18 A) by about 9 A due to the presence of adsorbed DNA. A model is presented to explain the structure of the lipid/DNA film

Additional details

Identifiers

DOI
10.1016/j.physb.2006.05.121;
PII
S0921-4526(06)00948-3;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
385-386
Journal Page Range
p. 841-844
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
8. international conference on neutron scattering
Dates
27 Nov - 2 Dec 2005
Place
Sydney (Australia)

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.