Published 1999 | Version v1
Book Metadata-only

Measurement of K x-ray fluorescence cross sections at 59.6 keV photons

Creators

  • 1. Dept. of Physics, Karnatak Univ., Dharwad (India)
  • 2. Dept. of Physics, J.S.S. College, Dharwad (India)

Description

The K x-ray fluorescence cross sections σK is determined by measuring the intensity of K x-ray radiation stimulated by 59.6 keV photons using a NaI (Tl) detector system attached to 1K multichannel analyser adopting a new method proposed earlier by us. The compounds of various elements in the range of atomic number 51 ≤Z≤66 have been used in the form of circular pellets for the measurements. The measured values of σK are compared with the best available theoretical values and a good agreement between them is obtained. (author)

Part of:
Proceedings of thirteenth national symposium on radiation physics: recent advances and future scenarios in accelerator radiation physics

Additional details

Publishing Information

Publisher
Indian Society for Radiation Physics
Imprint Place
Mumbai (India)
Imprint Title
Proceedings of thirteenth national symposium on radiation physics: recent advances and future scenarios in accelerator radiation physics
Imprint Pagination
685 p.
Journal Page Range
p. 598-601

Conference

Title
13. national symposium on radiation physics
Acronym
NSRP-13
Dates
21-23 Dec 1999
Place
Mangalagangotri (India)

INIS

Country of Publication
India
Country of Input or Organization
India
INIS RN
32004671
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANTIMONY OXIDES; BARIUM OXIDES; CERIUM OXIDES; COMPARATIVE EVALUATIONS; CROSS SECTIONS; DYSPROSIUM OXIDES; GADOLINIUM OXIDES; KEV RANGE 10-100; MULTI-CHANNEL ANALYZERS; NAI DETECTORS; PHOTONS; SAMARIUM OXIDES; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; ANTIMONY COMPOUNDS; BARIUM COMPOUNDS; BOSONS; CERIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; DYSPROSIUM COMPOUNDS; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; ENERGY RANGE; EQUIPMENT; EVALUATION; GADOLINIUM COMPOUNDS; KEV RANGE; MASSLESS PARTICLES; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PULSE ANALYZERS; RADIATION DETECTORS; RARE EARTH COMPOUNDS; SAMARIUM COMPOUNDS; SCINTILLATION COUNTERS; SOLID SCINTILLATION DETECTORS; SPECTRA; X-RAY EMISSION ANALYSIS

Optional Information

Notes
8 refs., 1 tab.