The characteristics of aluminium-doped zinc oxide films prepared by pulsed magnetron sputtering from powder targets
Description
Mixed zinc oxide and alumina powder targets have been used to prepare transparent semi-conductive films on glass by pulsed magnetron sputtering. The structure, crystallinity, optical properties, electrical properties and adhesion of the films were investigated using a range of techniques, including SEM, XRD, spectrophotometry, four-point probe and scratch adhesion testing. Also, the properties of the coatings before and after annealing under various conditions are compared. The crystallinity of the films increased and the preferred orientation in some of the samples changed from (1 0 0) to (0 0 2) after annealing. The transparent lines of the coatings showed blue shifts with the average transmittance within the visible range being up to 90%. Resistivities of the order of 10-3 Ω cm were obtained after annealing, without deterioration of the coating-to-substrate adhesion. The results to date demonstrate that the pulsed magnetron sputtering of Al-doped ZnO films from powder targets is a versatile, novel technique for the deposition of high quality transparent conductive oxide materials. As a demonstration of the flexibility of this technique, preliminary results from an investigation into indium-doped zinc oxide coatings are also included here
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2003.09.018;
- PII
- S0040609003012896;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 447-448
- Journal Issue
- 2
- Journal Page Range
- p. 33-39
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 30. international conference on metallurgical coatings and thin films
- Dates
- 28 Apr - 2 May 2003
- Place
- San Diego, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37016571
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; ALUMINIUM OXIDES; ANNEALING; COATINGS; DOPED MATERIALS; ELECTRICAL PROPERTIES; MAGNETRONS; OPTICAL PROPERTIES; POWDERS; SCANNING ELECTRON MICROSCOPY; SPECTROPHOTOMETRY; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; HEAT TREATMENTS; MATERIALS; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.