Published September 25, 1986
| Version v1
Journal article
Study of Nb-oxide Nb-Pb film structures by tunnel scanning microscope
Description
The surface of niobium films, which were earlier used to create niobium-niobium oxide-lead film structures on their base, was investigated, using tunnel scanning microscope. The results obtained agree well with the observed properties of these structures, containing josephson and tunnel junctions
Additional details
Additional titles
- Original title (Russian)
- Исследование плёночных структур Nb–оксид Nb–Pb с помощью сканирующего туннельного микроскопа
Publishing Information
- Journal Title
- Pis'ma Zh. Ehksp. Teor. Fiz.
- Journal Volume
- 44
- Journal Issue
- 6
- Series
- Pis'ma Zh. Ehksp. Teor. Fiz.
- Journal Page Range
- 285-287
- ISSN
- 0370-274X
- CODEN
- PZETA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 18043400
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTALS; ELECTRON MICROSCOPY; ELECTRON SCANNING; FILMS; JOSEPHSON JUNCTIONS; LEAD; NIOBIUM; NIOBIUM OXIDES; ROUGHNESS; TUNNEL EFFECT
- Descriptors DEC
- CHALCOGENIDES; ELEMENTS; METALS; MICROSCOPY; NIOBIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SURFACE PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- For English translation see the journal JETP Letters (USA).