MicroMegascope based dynamic surface force apparatus
Creators
- 1. Laboratoire de Physique de l'École Normale Supérieure, ENS, Université PSL, CNRS, Sorbonne Université, Université Paris-Diderot, Sorbonne Paris Cité, UMR CNRS 8550, 24 rue Lhomond, F-75005 Paris (France)
- 2. Département de Physique, Ecole Normale Supérieure—PSL Research University, CNRS, 24 rue Lhomond, F-75005 Paris (France)
Description
Surface force apparatus (SFA) allows accurate resolving of the interfacial properties of fluids confined between extended surfaces. The accuracy of the SFA makes it an ubiquitous tool for the nanoscale mechanical characterization of soft matter systems. The SFA traditionally measures force–distance profiles through interferometry with subnanometric distance precision. However, these techniques often require a dedicated and technically demanding experimental setup, and there remains a need for versatile and simple force–distance measurement tools. Here we present a MicroMegascope based dynamic SFA capable of accurate measurement of the dynamic force profile of a liquid confined between a millimetric sphere and a planar substrate. Normal and shear mechanical impedance is measured within the classical frequency modulation framework. We measure rheological and frictional properties from micrometric to molecular confinement. We also highlight the resolution of small interfacial features such as ionic liquid layering. This apparatus shows promise as a versatile force–distance measurement device for exotic surfaces or extreme environments. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6528/ab02baAdditional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 30
- Journal Issue
- 19
- Journal Page Range
- [6 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51047263
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ACCURACY; FREQUENCY MODULATION; INTERFEROMETRY; LAYERS; LIQUIDS; MECHANICAL IMPEDANCE; MOLTEN SALTS; NANOSTRUCTURES; SHEAR; SPHERES; SUBSTRATES; SURFACE FORCES; SURFACES
- Descriptors DEC
- FLUIDS; IMPEDANCE; MODULATION; SALTS