Published October 31, 2007
| Version v1
Journal article
Magnetic and structural study of Cu-doped TiO2 thin films
Creators
- 1. Dpto de Fisica-IFLP, Fac. Cs. Exactas, Universidad Nacional de La Plata-CONICET, CC 67, 1900 La Plata (Argentina)
- 2. Laboratorio de Ablacion Laser, Facultad de Ingenieria, Universidad de Buenos Aires, Paseo Colon 850, 1063 Buenos Aires (Argentina)
Description
Transparent pure and Cu-doped (2.5, 5 and 10 at.%) anatase TiO2 thin films were grown by pulsed laser deposition technique on LaAlO3 substrates. The samples were structurally characterized by X-ray absorption spectroscopy and X-ray diffraction. The magnetic properties were measured using a SQUID. All films have a FM-like behaviour. In the case of the Cu-doped samples, the magnetic cycles are almost independent of the Cu concentration. Cu atoms are forming CuO and/or substituting Ti in TiO2. The thermal treatment in air promotes the CuO segregation. Since CuO is antiferromagnetic, the magnetic signals present in the films could be assigned to Cu substitutionally replacing cations in TiO2
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2007.07.122Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2007.07.122;
- PII
- S0169-4332(07)00968-3;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 254
- Journal Issue
- 1
- Journal Page Range
- p. 365-367
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 13. international conference on solid films and surfaces
- Acronym
- ICSFS 13
- Dates
- 6-10 Nov 2006
- Place
- San Carlos de Bariloche (Argentina)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39097110
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ALUMINIUM COMPOUNDS; COPPER ADDITIONS; COPPER OXIDES; CRYSTAL GROWTH; DOPED MATERIALS; ENERGY BEAM DEPOSITION; HEAT TREATMENTS; LANTHANUM COMPOUNDS; LASER RADIATION; MAGNETIC PROPERTIES; OXYGEN COMPOUNDS; SEGREGATION; SQUID DEVICES; SUBSTRATES; THIN FILMS; TITANIUM OXIDES; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; COPPER ALLOYS; COPPER COMPOUNDS; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; FLUXMETERS; MATERIALS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING; SPECTROSCOPY; SUPERCONDUCTING DEVICES; SURFACE COATING; TITANIUM COMPOUNDS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.