Published 1991
| Version v1
Miscellaneous
Characterization of tin oxide thin films deposited of magnetron sputtering
- 1. Rio Grande do Sul Univ., Porto Alegre, RS (Brazil). Inst. de Fisica
Description
Published in summary form only
Additional details
Additional titles
- Original title (Portuguese)
- Caracterizacao de filmes finos de oxido de estanho depositados por magnetron sputtering
Publishing Information
- Imprint Title
- Proceedings of the 14. National Meeting on Condensed Matter Physics. v.2
- Imprint Pagination
- 201 p.
- Journal Page Range
- p. 361.
- Report number
- INIS-BR--2933
Conference
- Title
- 14. National Meeting on Condensed Matter Physics.
- Dates
- 7-11 May 1991.
- Place
- Caxambu, MG (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 23081840
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- CHEMICAL COMPOSITION; DEPOSITION; ELECTRIC CONDUCTIVITY; MOESSBAUER EFFECT; SPUTTERING; THIN FILMS; TIN OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; FILMS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TIN COMPOUNDS
Optional Information
- Notes
- Imprint:Anais do 14. Encontro Nacional de Fisica da Materia Condensada. v. 2.