Published January 5, 2010
| Version v1
Journal article
Microelectronics used for Semiconductor Imaging Detectors
Description
Semiconductor crystal technology, microelectronics developments and nuclear particle detection have been in a relation of symbiosis, all the way from the beginning. The increase of complexity in electronics chips can now be applied to obtain much more information on the incident nuclear radiation. Some basic technologies are described, in order to acquire insight in possibilities and limitations for the most recent detectors.
Additional details
Identifiers
- DOI
- 10.1063/1.3295677;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1204
- Journal Issue
- 1
- Journal Page Range
- p. 58-65
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 5. international summer school on nuclear physics methods and accelerators in biology and medicine
- Dates
- 6-15 Jul 2009
- Place
- Bratislava (Slovakia)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41099195
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARRIER MOBILITY; CRYSTALS; INTEGRATED CIRCUITS; MICROELECTRONICS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SENSORS
- Descriptors DEC
- ELECTRONIC CIRCUITS; MATERIALS; MICROELECTRONIC CIRCUITS; MOBILITY
Optional Information
- Notes
- (c) 2009 American Institute of Physics