Plasma Desorption Mass Spectrometry using TANDEM accelerator in National Industrial Research Inst. of Nagoya
- 1. Particle Beam Sceince Laboratory, Multi-Function Material Science Department, National Industrial Research Inst. of Nagoya, Nagoya (Japan)
Description
Plasma Desorption Mass Spectrometry (PDMS) analysis was studied using TANDEM accelerator. The heavy ions of MeV range emit the secondary ions of atoms, molecules, polymers and clusters from the irradiated samples without destruction. The analysis system of PDMS was designed and set-up using a mass spectrometer of Time of Flight and the TANDEM accelerator. The system performance was tested for C-60 fullerene on the surface of the samples using 11.2 MeV 28Si beams produced by the TANDEM accelerator of 1.7MV. The result shows that the hydrogen and hydrocarbons can be analyzed in the range of 1amu unit. The resolution (M/ΔM) of the Mass Spectrometry system is confirmed to be about 1000 from the separation of the 720 and 721amu peaks, which is attributed to the C-60 fullerene including 13C atoms. (H. Katsuta)
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Additional details
Publishing Information
- Imprint Title
- Proceedings of the 13th meeting for tandem accelerators and related techniques
- Imprint Pagination
- 137 p.
- Journal Page Range
- p. 84-85
- Report number
- JAERI-Conf--2000-019
Conference
- Title
- 13. meeting for tandem accelerators and related techniques
- Dates
- 8-9 Jun 2000
- Place
- Mutsu, Aomori (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 32036264
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC CLUSTERS; CARBON 13; FULLERENES; HEAVY IONS; MASS RESOLUTION; MASS SPECTROSCOPY; POLYMERS; SECONDARY EMISSION; SILICON 28 BEAMS; STRUCTURAL CHEMICAL ANALYSIS; TANDEM ELECTROSTATIC ACCELERATORS; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- ACCELERATORS; BEAMS; CARBON; CARBON ISOTOPES; CHARGED PARTICLES; ELECTROSTATIC ACCELERATORS; ELEMENTS; EMISSION; EVEN-ODD NUCLEI; ION BEAMS; IONS; ISOTOPES; LIGHT NUCLEI; NONMETALS; NUCLEI; RESOLUTION; SPECTROSCOPY; STABLE ISOTOPES
Optional Information
- Notes
- 4 figs.