Graded design of carrier concentration in PbTe by heat-treatment
Creators
- 1. Inst. of Multidisciplinary Research for Advanced Materials, Tohoku Univ., Sendai (Japan)
- 2. National Inst. for Materials Science, Tsukuba (Japan)
Description
In order to develop a new process of forming a carrier concentration gradient in lead telluride PbTe only by using heat-treatment, the effect of heat-treatment on a carrier concentration n of the p-type PbTe has been investigated, and the p-type PbTe has been heat-treated using a temperature gradient. The as-grown stoichiometric PbTe was p-type with an n of 1.0 x 1024m-3. Vacuum thermal exposure with Te-rich PbTe at 900 K for 1 h increased the n of the stoichiometric PbTe to 5.1 x 1024m-3, which indicates that hole formation was achieved by thermal exposure at this temperature and duration. The thermally exposed stoichiometric PbTe was heat-treated in the temperature range of 400 to 900 K for a period of 24 h. The n decreased with an increasing heat-treatment temperature of between 300 and 500 K, while the n increased with an increasing heat-treatment temperature of between 500 and 900 K. A minimum n was measured at 500 K, above which the formation energy of holes was determined to be 16.4 kJ/mol. On the basis of these results, a 19 mm long thermally exposed stoichiometric PbTe was heat-treated using a temperature gradient of 340-900 K for a period of 24 h. A continuous change in n was formed in the PbTe, and a minimum value of n was determined to be at a position corresponding to the heat-treatment temperature of 500 K. A continuous gradient of hole production was successfully achieved in the p-type PbTe only by heat-treatment using a temperature gradient. (orig.)
Additional details
Publishing Information
- Journal Title
- Materials Science Forum
- Journal Volume
- 423-425
- Journal Page Range
- p. 385-390
- ISSN
- 0255-5476
- CODEN
- MSFOEP
Conference
- Title
- 7. international symposium on functionally graded materials
- Acronym
- FGM 2002
- Dates
- 15-18 Oct 2002
- Place
- Beijing (China)
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 34072885
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARRIER DENSITY; ELECTRIC CONDUCTIVITY; HEAT TREATMENTS; HOLES; LEAD TELLURIDES; N-TYPE CONDUCTORS; P-TYPE CONDUCTORS; SPACE DEPENDENCE; TEMPERATURE DEPENDENCE; TEMPERATURE DISTRIBUTION; TEMPERATURE GRADIENTS; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- CHALCOGENIDES; ELECTRICAL PROPERTIES; LEAD COMPOUNDS; MATERIALS; PHYSICAL PROPERTIES; SEMICONDUCTOR MATERIALS; TELLURIDES; TELLURIUM COMPOUNDS; TEMPERATURE RANGE