Published September 1993 | Version v1
Journal article

Integration-type panoramic sample/hold circuit

  • 1. Academia Sinica, Beijing, BJ (China). Inst. of High Energy Physics

Description

The authors briefly describe a integration-type sample/hold circuit with wide frequency band response characteristics. The circuit design and the test results are introduced

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
13
Journal Issue
5
Journal Page Range
p. 314-317.
ISSN
0258-0934
CODEN
HDYUEC

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
26011802
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CIRCUIT THEORY; ELECTRIC CHARGES; ELECTRONIC CIRCUITS; FREQUENCY DEPENDENCE; FREQUENCY RESPONSE TESTING; INTEGRALS; PERFORMANCE; SAMPLING
Descriptors DEC
TESTING