Published July 12, 2001 | Version v1
Journal article

RBS and NRA of cobalt oxide thin films prepared by the sol-gel process

  • 1. Instituto de Fisica, UNAM, Apartado Postal 20-364, Mexico D.F. 01000 (Mexico)
  • 2. Departamento de Ingenieria de Procesos e Hidraulica, CBI, UAM-I, Universidad Autonoma Metropolitana Iztapalapa, A.P. 55-534, C.P. 09340, Mexico D.F. (Mexico)
  • 3. Escuela Superior de Ingenieria Mecanica y Electrica, IPN, C.P. 07738, Mexico D.F. (Mexico)
  • 4. Laboratorio de Fenomenos Criticos y Fluidos Complejos, Depto. Ciencias Basicas, UAM-A, A.P. 16-600, Mexico, D.F. 02011 (Mexico)

Description

This work presents a study of cobalt oxide thin films produced by the sol-gel process on aluminum and glass substrates. These films have been analyzed using two ion beam analysis (IBA) techniques: a) a standard RBS 4He 2 MeV and b) nuclear reaction analysis (NRA) using a 1 MeV deuterium beam. The 12C(d,p0)13C nuclear reaction provides information that carbon is incorporated into the film structure, which could be associated to the sinterization film process. Other film measurements such as optical properties, XRD, and SEM were performed in order to complement the IBA analysis. The results show that cobalt oxide film coatings prepared by this technique have good optical properties as solar absorbers and potential uses in solar energy applications

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
576
Journal Issue
1
Journal Page Range
p. 440-442
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
16. international conference on the application of accelerators in research and industry
Acronym
CAARI 2000
Dates
1-4 Nov 2000
Place
Denton, TX (United States)

Optional Information

Notes
(c) 2001 American Institute of Physics.