Published December 2003
| Version v1
Journal article
Particle Induced X-ray Emission (PIXE): theory. Analysis and characterization
Creators
- 1. Centre d'Etudes Nucleaires de Bordeaux-Gradignan, 33 (France)
- 2. CEA Saclay, Institut des Sciences et Techniques Nucleaires, 91 - Gif-sur-Yvette (France)
Description
The aim of this work is to show the analytical possibilities of the PIXE method and more particularly here in this first part to give the theoretical bases of the method. Are discussed respectively: the bases notions, the fluorescent atom, the cross sections, the continuous background noise and the secondary fluorescence. (O.M.)
Additional details
Additional titles
- Original title (French)
- Emission X induite par particules chargees (PIXE): theorie. Analyse et caracterisation
Publishing Information
- Journal Title
- Techniques de l'Ingenieur. Analyse et Caracterisation
- Journal Volume
- P3
- Journal Issue
- P148
- Journal Page Range
- p. P2557.1-P2557.8
- ISSN
- 1762-8717
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 35038774
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- BACKGROUND NOISE; CROSS SECTIONS; NUCLEAR REACTION ANALYSIS; PIXE ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SENSITIVITY; TRACE AMOUNTS
- Descriptors DEC
- CHEMICAL ANALYSIS; NOISE; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 19 refs.