PIXE analysis by baby cyclotron
- 1. Japan Steel Works Ltd., Tokyo (Japan)
Description
The Japan Steel Works, Ltd. has been supplying a very small sized cyclotron (Baby Cyclotron) to hospitals and research facilities. The cyclotron is designed to produce short-lived radioisotopes for medical use. In the present study, this cyclotron is modified so that it can serve for PIXE analysis. The PIXE (particle induced X-ray emission) technique has the following features: (1) Down to 1 ng of trace material in a sample (mg - μg) can be detected, (2) An analysis run is completed in one to ten minutes, permitting economical analysis for a large number of samples, (3) Several elements can be analyzed simultaneously, with an almost constant sensitivity for a variety of elements ranging from aluminum to heavy metals, (4) Analysis can be performed nondestructively without a chemical process, and (5) The use of microbeam can provide data on the distribution of elements with a resolution of several μm. Software for analysis is developed to allow the modified equipment to perform peak search, background fitting, and identification and determination of peaks. A study is now being conducted to examine the performance of the equipment for PIXE analysis of thin samples. Satisfactory results have been obtained. The analysis time, excluding the background correction, is 5-10 min. (Nogami, K.)
Additional details
Publishing Information
- Journal Title
- Nippon Aisotopu Hoshasen Sogo Kaigi Hobunshu
- Journal Issue
- no.18
- Series
- Nippon Aisotopu Hoshasen Sogo Kaigi Hobunshu.
- CODEN
- NAHHE
Conference
- Title
- 18. Japan conference on radiation and radioisotopes.
- Dates
- 25-27 Nov 1987.
- Place
- Tokyo (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 20017840
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CYCLOTRONS; IRRADIATION DEVICES; PEAKS; PIXE ANALYSIS; RADIATION DETECTORS; RESEARCH PROGRAMS; SPECIFICATIONS; SPECTROSCOPY
- Descriptors DEC
- ACCELERATORS; CHEMICAL ANALYSIS; CYCLIC ACCELERATORS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS