Published September 30, 2008 | Version v1
Journal article

Magnetic structures of exchange bias Ni/FeF2(1 1 0) interface

  • 1. Department of Physics Engineering, Mie University, 1577 Kurima-machiya, Tsu, Mie 514-8507 (Japan)

Description

Electronic and magnetic structures of ferromagnetic (FM)/antiferromagnetic (AFM), Ni/FeF2(1 1 0), with a compensated AFM interface are investigated by using the full-potential linearized augmented plane-wave method. We find that magnetic structures at the AFM interface are perturbed by a contact with the FM material, where the superexchange interaction through the interface F excites and induces a small net moment at the AFM interface. These results predicted may play an important role for explaining the exchange bias in this system, and rule out the exchange bias mechanisms with the spin-flop coupling and the magnetic moment reorientation

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.02.081

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.02.081;
PII
S0169-4332(08)00301-2;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
254
Journal Issue
23
Journal Page Range
p. 7794-7796
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
9. international conference on atomically controlled surfaces, interfaces and nanostructures
Acronym
ASCIN-9
Dates
11-15 Nov 2007
Place
Tokyo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40032181
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; INTERACTIONS; INTERFACES; IRON FLUORIDES; MAGNETIC MOMENTS; NICKEL; WAVE PROPAGATION
Descriptors DEC
ELEMENTS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; IRON COMPOUNDS; MAGNETISM; METALS; MICROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.