One-stage probe-forming systems with quadrupole lenses excited by individual power supplies
- 1. Sumy State University, 2 Rymski-Korsakov St., 40007 Sumy (Ukraine)
- 2. Institute of Applied Physics, NAS of Ukraine, 58 Petropavlovskaya St., 40030 Sumy (Ukraine)
Description
The work deals with the ion-optical characteristics of the probe-forming systems based on a quadruplet of magnetic quadrupole lenses with four power supplies. The excitation of the lenses of a final doublet of such system is determined from the stigmatic focusing conditions, and the excitations of the first two lenses (downstream the beam) are free parameters which form a parametric set of the probe-forming systems. For this parametric set, the system acceptance reduced to the envelope dimensions in the target plane is determined as a figure of merit for the optimization task. The solution of this task gives optimal excitations of the first two lenses allowing an increase in demagnifications and acceptance of the probe-forming systems with individual power supplies in comparison with a separated Russian quadruplet.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2011.02.025Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2011.02.025;
- PII
- S0168-583X(11)00208-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 269
- Journal Issue
- 20
- Journal Page Range
- p. 2202-2205
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 12. international conference on nuclear microprobe technology and applications
- Acronym
- ICMTA-12
- Dates
- 26-30 Jul 2010
- Place
- Leipzig (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43102595
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EXCITATION; FOCUSING; ION BEAMS; IONS; LENSES; OPTICAL PROPERTIES; OPTIMIZATION; POWER SUPPLIES; PROBES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELECTRONIC EQUIPMENT; ENERGY-LEVEL TRANSITIONS; EQUIPMENT; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.