Published October 15, 2011 | Version v1
Journal article

One-stage probe-forming systems with quadrupole lenses excited by individual power supplies

  • 1. Sumy State University, 2 Rymski-Korsakov St., 40007 Sumy (Ukraine)
  • 2. Institute of Applied Physics, NAS of Ukraine, 58 Petropavlovskaya St., 40030 Sumy (Ukraine)

Description

The work deals with the ion-optical characteristics of the probe-forming systems based on a quadruplet of magnetic quadrupole lenses with four power supplies. The excitation of the lenses of a final doublet of such system is determined from the stigmatic focusing conditions, and the excitations of the first two lenses (downstream the beam) are free parameters which form a parametric set of the probe-forming systems. For this parametric set, the system acceptance reduced to the envelope dimensions in the target plane is determined as a figure of merit for the optimization task. The solution of this task gives optimal excitations of the first two lenses allowing an increase in demagnifications and acceptance of the probe-forming systems with individual power supplies in comparison with a separated Russian quadruplet.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2011.02.025

Additional details

Identifiers

DOI
10.1016/j.nimb.2011.02.025;
PII
S0168-583X(11)00208-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
269
Journal Issue
20
Journal Page Range
p. 2202-2205
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
12. international conference on nuclear microprobe technology and applications
Acronym
ICMTA-12
Dates
26-30 Jul 2010
Place
Leipzig (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43102595
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
EXCITATION; FOCUSING; ION BEAMS; IONS; LENSES; OPTICAL PROPERTIES; OPTIMIZATION; POWER SUPPLIES; PROBES
Descriptors DEC
BEAMS; CHARGED PARTICLES; ELECTRONIC EQUIPMENT; ENERGY-LEVEL TRANSITIONS; EQUIPMENT; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.