Published July 2005
| Version v1
Journal article
Stresses in Selectively Oxidized GaAs/(AlGa)xOy Structures
Creators
- 1. Ioffe Physicotechnical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021 (Russian Federation)
Description
Raman scattering spectroscopy is used to study the process of selective oxidation of Al0.97Ga0.03As layers. Stresses arising in GaAs/(AlGa)xOy layers as a result of selective oxidation under different conditions are determined. The effects of local heating of the samples with laser radiation during measurements of the Raman signals, photoresist hardening resulting from the oxidation, and overoxidation are analyzed. The instrumentation and method of selective oxidation are optimized; as a result, arrays of vertical-cavity surface-emitting lasers are fabricated. The active region of these lasers is based on two InGaAs quantum wells with top oxidized and bottom semiconductor distributed Bragg reflectors
Additional details
Identifiers
- DOI
- 10.1134/1.1992627;
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 39
- Journal Issue
- 7
- Journal Page Range
- p. 748-753
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37031341
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Translation
- Descriptors DEI
- ALUMINIUM OXIDES; FABRICATION; GALLIUM ARSENIDES; GALLIUM OXIDES; HARDENING; HEATING; LASER RADIATION; LASERS; LAYERS; OXIDATION; QUANTUM WELLS; RAMAN EFFECT; RAMAN SPECTRA; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; STRESSES; SURFACES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; CHALCOGENIDES; CHEMICAL REACTIONS; ELECTROMAGNETIC RADIATION; GALLIUM COMPOUNDS; MATERIALS; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS; PNICTIDES; RADIATIONS; SPECTRA
Optional Information
- Notes
- Translated from Fizika i Tekhnika Poluprovodnikov, ISSN 0015-3222, 39, 782-787 (No. 7, 2005); (c) 2005 Pleiades Publishing, Inc.