Published April 22, 2013 | Version v1
Journal article

Path aggregation techniques for EXAFS visualization and analysis

Creators

  • 1. National Institute of Standards and Technology, Gaithersburg, MD 20899 (United States)

Description

The path expansion model used by feff considers the EXAFS spectrum as the sum of contributions from scattering geometries of two or more atoms in a cluster surrounding the absorbing atom. This model and its representation as a collection of files is the basis for a number of popular EXAFS analysis programs, including one co-developed by me. Here I present several tools which build upon the scattering path model to articulate analysis and visualization capabilities not normally included in feff-based analysis software. These include the generation of arbitrary single-scattering paths not represented in feffs input structure, consideration of non-Gaussian and non-cumulant distribution functions, easy visualization of arbitrary path summations, and others. Each of these tools is tightly integrated into the artemis EXAFS analysis program, making these analysis and visualization tools easily and widely available.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/430/1/012006

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
430
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1742-6596

Conference

Title
15. international conference on X-ray absorption fine structure
Acronym
XAFS15
Dates
22-28 Jul 2012
Place
Beijing (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44113770
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; AGGLOMERATION; ATOMS; COMPUTER CODES; DISTRIBUTION FUNCTIONS; EXPANSION; FINE STRUCTURE; SCATTERING; SPECTRA; TOOLS; X-RAY SPECTROSCOPY
Descriptors DEC
EQUIPMENT; FUNCTIONS; SPECTROSCOPY