Published February 28, 2003
| Version v1
Journal article
Lattice deformation in laser-irradiated silicon crystal studied by picosecond X-ray diffraction
Description
Lattice deformation in laser-irradiated Si(1 1 1) has been studied by picosecond X-ray diffraction at a delay time of 350 ps. The rapid thermal expansion (0.24% at maximum) was observed at 2.0 GW/cm2 irradiation. By irradiation above dielectric breakdown threshold (10.0 GW/cm2), the intense lattice compression (2.1% at maximum) was observed. The compression is caused by the laser ablation due to dielectric breakdown
Additional details
Identifiers
- DOI
- 10.1016/S0169-4332(02)01509-X;
- arXiv
- arXiv:hep-th/0112025v2;
- PII
- S016943320201509X;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 207
- Journal Issue
- 1-4
- Journal Page Range
- p. 314-317
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38086360
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABLATION; BREAKDOWN; COMPRESSION; CRYSTALS; DEFORMATION; DIELECTRIC MATERIALS; IRRADIATION; LASERS; SILICON; THERMAL EXPANSION; TIME RESOLUTION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELEMENTS; EXPANSION; MATERIALS; RESOLUTION; SCATTERING; SEMIMETALS; TIMING PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.