Published March 2010 | Version v1
Journal article

Luminescence and ESR characteristics of γ-irradiated Lu3Al5O12:Ce single crystalline film scintillators

  • 1. Laboratory of Optoelectronic Materials, Electronics Department, Ivan Franko National University of Lviv, General Tarnavsky Str., 107, 79017 Lviv (Ukraine)
  • 2. Institute of Physics AS CR, Cukrovarnicka 10, 162 53 Prague (Czech Republic)
  • 3. Physical Faculty, Moscow State University, 119899 Moscow (Russian Federation)

Description

The influence of γ-irradiation with a dose of ∼104 Gy on the characteristics of LuAG:Ce single crystalline films (SCF) was investigated using ESR and time-resolved luminescence spectroscopy under excitation by synchrotron radiation with the energies ranging from 3.7 to 12 eV. The origin of γ-ray induced radiation defects in LuAG:Ce SCF is discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radmeas.2009.11.042

Additional details

Identifiers

DOI
10.1016/j.radmeas.2009.11.042;
PII
S1350-4487(09)00362-X;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
45
Journal Issue
3-6
Journal Page Range
p. 419-421
ISSN
1350-4487
CODEN
RMEAEP

Conference

Title
7. European conference on luminescent detectors and transformers of ionizing radiation
Acronym
LUMDETR 2009
Dates
8-13 Jul 2009
Place
Krakow (Poland)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42009039
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON SPIN RESONANCE; FILMS; GAMMA RADIATION; GARNETS; LUMINESCENCE; MONOCRYSTALS; PHOSPHORS; RADIATION EFFECTS; SPECTROSCOPY; SYNCHROTRON RADIATION; TIME RESOLUTION
Descriptors DEC
BREMSSTRAHLUNG; CRYSTALS; ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; MAGNETIC RESONANCE; MINERALS; PHOTON EMISSION; RADIATIONS; RESOLUTION; RESONANCE; SILICATE MINERALS; TIMING PROPERTIES

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.