A model for annealing of nuclear tracks in solids
Creators
- 1. Physics Division, Directorate of Science, PINSTECH, P.O. Nilore, Islamabad (Pakistan)
Description
A mathematical formula is derived for annealing of radiation induced damage in solids starting with the empirical equation having a form of the Arrhenius equation. This formula is transformed into a practical relationship in the usable form to fit the experimental track annealing data by making use of a relationship between fractional defect density in the latent track and etched track length. Calculated lengths of fission fragment tracks in annealed CR-39 based on the proposed model are compared with corresponding experimental measurements (our previously published results). A very good agreement is found between calculated results and experimental measurements. Physical meanings of parameters involved in the proposed model are given with appropriate theoretical explanation guided by analysis based on the model-fit on track annealing measurements. The results in this paper are useful for a wide spectrum of researchers including cosmic-ray physicists, geologists, nuclear track methodologists and semiconductor/accelerator physicists using ions implantation for doping semiconductors and materials modifications
Additional details
Identifiers
- DOI
- 10.1016/j.radmeas.2007.01.039;
- PII
- S1350-4487(07)00048-0;
Publishing Information
- Journal Title
- Radiation Measurements
- Journal Volume
- 42
- Journal Issue
- 3
- Journal Page Range
- p. 317-322
- ISSN
- 1350-4487
- CODEN
- RMEAEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38097273
- Subject category
- S61: RADIATION PROTECTION AND DOSIMETRY;
- Descriptors DEI
- ACCELERATORS; ANNEALING; ARRHENIUS EQUATION; COSMIC RADIATION; DEFECTS; FISSION FRAGMENTS; ION IMPLANTATION; PARTICLE TRACKS; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- EQUATIONS; HEAT TREATMENTS; IONIZING RADIATIONS; MATERIALS; NUCLEAR FRAGMENTS; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.