Published March 2007 | Version v1
Journal article

A model for annealing of nuclear tracks in solids

  • 1. Physics Division, Directorate of Science, PINSTECH, P.O. Nilore, Islamabad (Pakistan)

Description

A mathematical formula is derived for annealing of radiation induced damage in solids starting with the empirical equation having a form of the Arrhenius equation. This formula is transformed into a practical relationship in the usable form to fit the experimental track annealing data by making use of a relationship between fractional defect density in the latent track and etched track length. Calculated lengths of fission fragment tracks in annealed CR-39 based on the proposed model are compared with corresponding experimental measurements (our previously published results). A very good agreement is found between calculated results and experimental measurements. Physical meanings of parameters involved in the proposed model are given with appropriate theoretical explanation guided by analysis based on the model-fit on track annealing measurements. The results in this paper are useful for a wide spectrum of researchers including cosmic-ray physicists, geologists, nuclear track methodologists and semiconductor/accelerator physicists using ions implantation for doping semiconductors and materials modifications

Additional details

Identifiers

DOI
10.1016/j.radmeas.2007.01.039;
PII
S1350-4487(07)00048-0;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
42
Journal Issue
3
Journal Page Range
p. 317-322
ISSN
1350-4487
CODEN
RMEAEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38097273
Subject category
S61: RADIATION PROTECTION AND DOSIMETRY;
Descriptors DEI
ACCELERATORS; ANNEALING; ARRHENIUS EQUATION; COSMIC RADIATION; DEFECTS; FISSION FRAGMENTS; ION IMPLANTATION; PARTICLE TRACKS; SEMICONDUCTOR MATERIALS
Descriptors DEC
EQUATIONS; HEAT TREATMENTS; IONIZING RADIATIONS; MATERIALS; NUCLEAR FRAGMENTS; RADIATIONS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.