Published 1991
| Version v1
Report
Solid-state and materials research: solid state interaction in thin film structures. Cross-sectional microscopy of nickel silicides formation
Creators
- 1. University of the Western Cape, Bellville (South Africa)
- 2. National Accelerator Centre, Faure (South Africa)
Description
Short communication. 1 fig
Additional details
Publishing Information
- ISBN
- 1 8748 7703 3
- Imprint Title
- NAC annual report March 1991
- Imprint Pagination
- 129 p.
- Journal Page Range
- p. 63.
- Report number
- NAC-AR--91-01
INIS
- Country of Publication
- South Africa
- Country of Input or Organization
- South Africa
- INIS RN
- 24058181
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Progress Report, No Abstract, Non-conventional Literature
- Descriptors DEI
- ANNEALING; BACKSCATTERING; MONOCRYSTALS; NICKEL; NICKEL SILICIDES; NUCLEATION; PHASE TRANSFORMATIONS; PROGRESS REPORT; RUTHERFORD SCATTERING; SILICON; THIN FILMS; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- CRYSTALS; DOCUMENT TYPES; ELASTIC SCATTERING; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HEAT TREATMENTS; METALS; MICROSCOPY; NICKEL COMPOUNDS; SCATTERING; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS