Published January 1, 2012
| Version v1
Journal article
Bias drop and phonon emission in molecular wires
- 1. Nano Electronics Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501 (Japan)
- 2. Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573 (Japan)
Description
Using the recursion-transfer-matrix (RTM) method combined with the non-equilibrium Green's function (NEGF) method and density-functional theory, we perform ab initio calculations for the electron transport of molecular wires bridged between electrodes. We present an effective potential of molecular wire under a finite bias voltage and discuss the phonon emission and local heating due to inelastic electron-phonon coupling effects. We find that it is strongly dependent on contact conditions. When the contacts to electrodes are bad, excitation phonon modes at contacts become dominant for the energy dissipation.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2011.03.125Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2011.03.125;
- PII
- S0169-4332(11)00489-2;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 258
- Journal Issue
- 6
- Journal Page Range
- p. 2121-2123
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- International vacuum congress
- Acronym
- IVC-18
- Dates
- 23-27 Aug 2010
- Place
- Beijing (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44031080
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DENSITY FUNCTIONAL METHOD; ELECTRIC FIELDS; ELECTRON TRANSFER; ELECTRON-PHONON COUPLING; EMISSION; ENERGY LOSSES; EQUILIBRIUM; EXCITATION; GREEN FUNCTION; INELASTIC SCATTERING; PHONONS; SCREENING
- Descriptors DEC
- CALCULATION METHODS; COUPLING; ENERGY-LEVEL TRANSITIONS; FUNCTIONS; LOSSES; QUASI PARTICLES; SCATTERING; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.