Evaluation of hardening degree on plates containing vehicle identification number (VIN)
Creators
- 1. Universidade do Estado do Rio de Janeiro (PPG-EM/UERJ), RJ (Brazil). Programa de Pos-Graduacao em Engenharia Mecanica
Description
The metallographic examination is one of the most widely used methods for the revealing of Vehicular Identification Number (VIN) on tampered vehicles, allowing a fast and reliable mean of identification. The application of the method is possible only in plates that contain hardening and residual stresses levels arising from the original recording process, persistent after the suppression of original coding. The higher the degree of hardening generated in the original recording process, the greater the probability of success in revealing the suppressed NIV. Optical microscopy, scanning electron microscopy, energy dispersive spectroscopy and X-ray fluorescence techniques were used to characterize two groups of plates containing stamped NIV. Residual stresses were measured by X-ray diffraction and results showed that the stamping recording method makes the revealing of the suppressed coding easier. (author)
Files
49055510.pdf
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Additional details
Additional titles
- Original title (Portuguese)
- Avaliacao do grau de encruamento em chapas contendo numero de identificacao veicular (NIV)
Publishing Information
- Imprint Pagination
- 9 p.
- Report number
- INIS-BR--20660
Conference
- Title
- Brazilian congress of engineering and materials science
- Original Conference Title
- 22. CBECIMAT: congresso brasileiro de engenharia e ciencia dos materiais
- Acronym
- 22. CBECIMAT
- Dates
- 6-10 Nov 2016
- Place
- Natal, RN (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 49055510
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- HARDENING; IDENTIFICATION SYSTEMS; METALLOGRAPHY; OPTICAL MICROSCOPY; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; VEHICLES; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; SCATTERING; STRESSES; X-RAY EMISSION ANALYSIS