Published September 1973
| Version v1
Journal article
Economic semiconductor measuring circuit for a scintillation flaw detector
Creators
- 1. Tomskij Politekhnicheskij Inst. (USSR). Nauchno-Issledovatel'skij Inst. Ehlektronnoj Introskopii
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Экономичная полупроводниковая измерительная схема сцинтилляционного дефектоскопа
Publishing Information
- Journal Title
- Prib. Tekh. Ehksp.
- Journal Issue
- no.5
- Series
- Prib. Tekh. Ehksp.
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 5112917
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
- Descriptors DEI
- ACCURACY; ELECTRONIC CIRCUITS; FIELD EFFECT TRANSISTORS; THICKNESS GAGES
- Descriptors DEC
- MEASURING INSTRUMENTS; SEMICONDUCTOR DEVICES; TRANSISTORS
Optional Information
- Notes
- For English translation see the journal Instrum. Exp. Tech.