Published December 2016 | Version v1
Journal article

Custom sample environments at the ALBA XPEEM

Description

A variety of custom-built sample holders offer users a wide range of non-standard measurements at the ALBA synchrotron PhotoEmission Electron Microscope (PEEM) experimental station. Some of the salient features are: an ultrahigh vacuum (UHV) suitcase compatible with many offline deposition and characterization systems, built-in electromagnets for uni- or biaxial in-plane (IP) and out-of-plane (OOP) fields, as well as the combination of magnetic fields with electric fields or current injection. Electronics providing a synchronized sinusoidal signal for sample excitation enable time-resolved measurements at the 500 MHz storage ring RF frequency. - Highlights: • Custom sample environment for XPEEM at ALBA. • Sample holders with electromagnets, in-plane dipole, in-plane quadruple and out-of-plane. • Sample holders with printed circuit boards for electric contacts including electromagnets. • UHV suitcase adapter. • Synchronized 500 MHz electrical excitation for time resolved measurements.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2016.08.016

Additional details

Identifiers

DOI
10.1016/j.ultramic.2016.08.016;
PII
S0304-3991(16)30173-5;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
171
Journal Page Range
p. 63-69
ISSN
0304-3991
CODEN
ULTRD6

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.