Custom sample environments at the ALBA XPEEM
Description
A variety of custom-built sample holders offer users a wide range of non-standard measurements at the ALBA synchrotron PhotoEmission Electron Microscope (PEEM) experimental station. Some of the salient features are: an ultrahigh vacuum (UHV) suitcase compatible with many offline deposition and characterization systems, built-in electromagnets for uni- or biaxial in-plane (IP) and out-of-plane (OOP) fields, as well as the combination of magnetic fields with electric fields or current injection. Electronics providing a synchronized sinusoidal signal for sample excitation enable time-resolved measurements at the 500 MHz storage ring RF frequency. - Highlights: • Custom sample environment for XPEEM at ALBA. • Sample holders with electromagnets, in-plane dipole, in-plane quadruple and out-of-plane. • Sample holders with printed circuit boards for electric contacts including electromagnets. • UHV suitcase adapter. • Synchronized 500 MHz electrical excitation for time resolved measurements.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2016.08.016Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2016.08.016;
- PII
- S0304-3991(16)30173-5;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 171
- Journal Page Range
- p. 63-69
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48085967
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIPOLES; ELECTRIC CONTACTS; ELECTRIC FIELDS; ELECTROMAGNETS; ELECTRON MICROSCOPES; EMISSION SPECTROSCOPY; EXCITATION; MAGNETIC FIELDS; MHZ RANGE 100-1000; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PRINTED CIRCUITS; QUADRUPOLES; SAMPLE HOLDERS; SIGNALS; STORAGE RINGS; SYNCHROTRONS; TIME RESOLUTION
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; ELECTRICAL EQUIPMENT; ELECTRON SPECTROSCOPY; ELECTRONIC CIRCUITS; EMISSION; ENERGY-LEVEL TRANSITIONS; EQUIPMENT; FREQUENCY RANGE; MAGNETS; MHZ RANGE; MICROSCOPES; MULTIPOLES; RESOLUTION; SECONDARY EMISSION; SPECTROSCOPY; TIMING PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.