Texture analysis with the new HIPPO TOF diffractometer
Creators
Description
The new neutron time-of-flight (TOF) diffractometer HIPPO (High-Pressure-Preferred Orientation) at LANSCE (Los Alamos Neutron Science Center) is described and results for quantitative texture analysis of a standard sample are discussed. HIPPO overcomes the problem of weak neutron scattering intensities by taking advantage of the improved source at LANSCE, a short flight path (9 m) and a novel three-dimensional arrangement of detector banks with 1360 3He tubes, on five conical rings with scattering angles ranging from 2θ=10 deg. to 150 deg. Flux at the sample is on the order of 107 neutrons cm-2 s-1. A large sample chamber (75 cm diameter well) can accommodate ancillary equipment such as an automatic sample changer/goniometer used in this study. This instrument was used to measure the texture of a round-robin limestone standard and extract orientation distribution data from TOF diffraction spectra with different methods (Rietveld harmonic method, Rietveld direct method, automatic fitting of individual peak intensities), and the results compare favorably. Also, there is good agreement with results obtained on the same sample measured at other facilities, but with greatly reduced measuring time for HIPPO
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2003.05.001;
- PII
- S0168900203023167;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 515
- Journal Issue
- 3
- Journal Page Range
- p. 575-588
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Slovenia
- INIS RN
- 35047919
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- GONIOMETERS; NEUTRON DIFFRACTION; NEUTRON DIFFRACTOMETERS; SAMPLE CHANGERS; TEXTURE; TIME-OF-FLIGHT SPECTROMETERS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; MEASURING INSTRUMENTS; SCATTERING; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.