Characterization of technical surfaces with a coupled SEM-EDA-image analyzer system

A coupled system of SEM-EDA and quantitative image analysis was used to determine the local distribution of the elements Al, Mg, Ni and Cr on a limiter surface exposed to the fusion plasma. The example of a graphite limiter surface covered with droplets of INCONEL 600 was used to show how the droplet volume distribution can be automatically determined with an image from the scanning electron microscope together with the IBAS II image analysis system. (Author)