Published 1976
| Version v1
Report
Open
Application of the positron annihilation method to studies on the surface defects of semiconductor materials
Description
no abstract available
Files
8304257.pdf
Files
(97.2 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:ff10121c1b4dbdfab29e2eb145a01d80
|
97.2 kB | Preview Download |
System files
(4.0 kB)
| Name | Size | Download all |
|---|
Additional details
Additional titles
- Original title (Russian)
- Применение метода аннигиляции позитронов для исследования дефектов поверхности полупроводниковых материалов
Publishing Information
- Imprint Title
- Summaries of reports of 26. conference on nuclear spectroscopy and nuclear structure, Baku, 3-6 Feb 1976
- Imprint Pagination
- p. 385.
- Report number
- INIS-mf--3329
Conference
- Title
- 26. conference on nuclear spectroscopy and nuclear structure.
- Dates
- 3 Feb 1976.
- Place
- Baku, USSR.
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 8304257
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ANGULAR CORRELATION; ANNIHILATION; ELECTRON MICROSCOPY; GALLIUM ARSENIDES; MONOCRYSTALS; N-TYPE CONDUCTORS; OPTICAL MICROSCOPY; POINT DEFECTS; POSITRONS; SILICON
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; ARSENIC COMPOUNDS; ARSENIDES; CORRELATIONS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; GALLIUM COMPOUNDS; INTERACTIONS; LEPTONS; MATTER; MICROSCOPY; PARTICLE INTERACTIONS; SEMICONDUCTOR MATERIALS; SEMIMETALS
Optional Information
- Notes
- Published in summary form only. Imprint:Tezisy dokladov 26. soveshchaniya po yadernoj spektroskopii i strukture atomnogo yadra, Baku, 3-6 Feb 1976.