Published December 21, 2013 | Version v1
Journal article

Qualification of a new supplier for silicon particle detectors

  • 1. Institute of High Energy Physics, Austrian Academy of Sciences, Vienna (Austria)
  • 2. Infineon Technologies Austria AG, Villach (Austria)
  • 3. Infineon Technologies AG, Munich (Germany)

Description

Most modern particle physics experiments use silicon based sensors for their tracking systems. These sensors are able to detect particles generated in high energy collisions with high spatial resolution and therefore allow the precise reconstruction of particle tracks. So far only a few vendors are capable of producing silicon strip sensors with the quality needed in particle physics experiments. Together with the European semiconductor manufacturer Infineon Technologies Austria AG the Institute of High Energy Physics of the Austrian Academy of Sciences developed planar silicon strip sensors in p-on-n technology. This paper presents the development, production and results from the electrical characterisation of the first sensors produced by Infineon

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2013.07.022

Additional details

Identifiers

DOI
10.1016/j.nima.2013.07.022;
PII
S0168-9002(13)00998-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
732
Journal Page Range
p. 74-78
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
13. Vienna conference on instrumentation
Dates
11-15 Feb 2013
Place
Vienna (Austria)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45051600
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AVAILABILITY; JUNCTION DETECTORS; PARTICLE TRACKS; SENSORS; SI SEMICONDUCTOR DETECTORS; SPATIAL RESOLUTION
Descriptors DEC
MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.