Qualification of a new supplier for silicon particle detectors
Creators
- 1. Institute of High Energy Physics, Austrian Academy of Sciences, Vienna (Austria)
- 2. Infineon Technologies Austria AG, Villach (Austria)
- 3. Infineon Technologies AG, Munich (Germany)
Description
Most modern particle physics experiments use silicon based sensors for their tracking systems. These sensors are able to detect particles generated in high energy collisions with high spatial resolution and therefore allow the precise reconstruction of particle tracks. So far only a few vendors are capable of producing silicon strip sensors with the quality needed in particle physics experiments. Together with the European semiconductor manufacturer Infineon Technologies Austria AG the Institute of High Energy Physics of the Austrian Academy of Sciences developed planar silicon strip sensors in p-on-n technology. This paper presents the development, production and results from the electrical characterisation of the first sensors produced by Infineon
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2013.07.022Additional details
Identifiers
- DOI
- 10.1016/j.nima.2013.07.022;
- PII
- S0168-9002(13)00998-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 732
- Journal Page Range
- p. 74-78
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 13. Vienna conference on instrumentation
- Dates
- 11-15 Feb 2013
- Place
- Vienna (Austria)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45051600
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AVAILABILITY; JUNCTION DETECTORS; PARTICLE TRACKS; SENSORS; SI SEMICONDUCTOR DETECTORS; SPATIAL RESOLUTION
- Descriptors DEC
- MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.