Published July 11, 2011 | Version v1
Journal article

Plane problems of cubic quasicrystal media with an elliptic hole or a crack

  • 1. Institute of Mechanics, University of Kassel, Kassel 34125 (Germany)
  • 2. College of Science, China Agricultural University, Beijing 100083 (China)

Description

Based on the complex potential method, plane problems of cubic quasicrystal media containing an elliptic hole subjected to uniform remote loadings are solved. The explicit solutions for the coupled fields are given in the closed form. Degenerating the elliptic hole into a crack, the asymptotic distribution of the phonon and phason stress fields near the crack tip exhibits inverse square root singularities. Explicit expressions for the stress intensity factors, crack opening displacements and strain energy release rate are also presented. -- Highlights: → Lekhnitskii's formalism is extended to cubic QC solids. → The plane problem of an elliptic hole or crack is investigated. → Analytical expressions for both entire and asymptotic fields are determined. → The stress intensity factors are independent of material constants. → The coupled field strongly affects the configuration and strain energy of the crack.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2011.06.003

Additional details

Identifiers

DOI
10.1016/j.physleta.2011.06.003;
PII
S0375-9601(11)00696-7;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
375
Journal Issue
28-29
Journal Page Range
p. 2775-2781
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45056008
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ASYMPTOTIC SOLUTIONS; CRACKS; HOLES; OPENINGS; PHONONS; POTENTIALS; SINGULARITY; SOLIDS; STRAINS; STRESS INTENSITY FACTORS; STRESSES
Descriptors DEC
MATHEMATICAL SOLUTIONS; QUASI PARTICLES

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.