Published May 1981
| Version v1
Journal article
Neutron diffraction study of defects in silicon monocrystals
- 1. Nauchno-Issledovatel'skij Fiziko-Khimicheskij Inst., Moscow (USSR)
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Нейтронографическое исследование дефектов в монокристаллах кремния
Publishing Information
- Journal Title
- Kristallografiya
- Journal Volume
- 26
- Journal Issue
- 3
- Series
- Kristallografiya.
- Journal Page Range
- 625-627
- ISSN
- 0023-4761
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 14744007
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ANNEALING; BRAGG REFLECTION; CRYSTAL DEFECTS; HIGH TEMPERATURE; MEDIUM TEMPERATURE; MONOCRYSTALS; NEUTRON DIFFRACTION; PHYSICAL RADIATION EFFECTS; RADIATION DOSES; SILICON
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELEMENTS; HEAT TREATMENTS; RADIATION EFFECTS; REFLECTION; SCATTERING; SEMIMETALS
Optional Information
- Notes
- Short note. For English translation see the journal Soviet Physics - Crystallography (USA).