Resonance effects in quantum interference devices with tunnel junctions

The step structure in the current-voltage characteristic of a SQUID in thin film technique with tunnel junctions is discussed. The comparison of the measured step voltage and the values calculated with the assumption of resonance in the SQUID loop gives acceptable values of the dielectric constant of photoresist. With a simple dc measuring method of the voltage quantum interferences of SQUID's with step structure in the I-U characteristics the flux resolution is in the range between 10-4 and 10-3 PHI0 in the transition of the steps. (author)