Published December 22, 2014
| Version v1
Journal article
Negative magnetoresistance in a low-k dielectric
Creators
- 1. College of Nanoscale Science and Engineering, SUNY Polytechnic Institute, 257 Fuller Road, Albany, New York 12203 (United States)
Description
We observed negative magnetoresistance in amorphous SiCOH, a low-k dielectric, applying modest magnetic fields (<150 Gauss) at room temperature. The conductivity increases with increasing magnetic field. The change in conductivity due to the applied magnetic field increases with electric field and has little or no temperature dependence over the range studied. The magnitude of the effect is independent of the orientation of magnetic field relative to the direction of current flow. The effect is attributed to spin constraints associated with double occupancy of a trap site under the assumption that trap sites which have double occupancy have lower hopping frequencies than traps that have single occupancy
Additional details
Identifiers
- DOI
- 10.1063/1.4904999;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 105
- Journal Issue
- 25
- Journal Page Range
- p. 252902-252902.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46101281
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DIELECTRIC MATERIALS; ELECTRIC CURRENTS; ELECTRIC FIELDS; LIMITING VALUES; MAGNETIC FIELDS; MAGNETORESISTANCE; ORIENTATION; SPIN; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TRAPS
- Descriptors DEC
- ANGULAR MOMENTUM; CURRENTS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; MATERIALS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC