Published 2008
| Version v1
Journal article
Silicon 3D pixel detectors with the ATLAS pixel readout electronics: Laboratory and test-beam measurements
Creators
- 1. Physikalisches Institut, Universitaet Bonn (Germany)
- 2. University of Hawaii, Honolulu (United States)
- 3. University of Manchester (United Kingdom)
Description
no abstract available
Availability note (English)
Also available online: http://www.dpg-tagungen.de/index_en.htmlAdditional details
Additional titles
- Original title (German)
- Silizium 3D Pixel Detektoren mit der ATLAS-Pixel Ausleseelektronik: Labor- und Teststrahlmessungen
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Volume
- 43
- Journal Issue
- 2
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 2008 Spring meeting of the professional associations Extraterrestrial Physics, Gravitation and Relativity Theory, Particle Physics, Theoretical and Mathematical Basics of Physics of the German Physical Society (DPG)
- Original Conference Title
- Fruehjahrstagung 2008 der Fachverbaende Extraterrestrische Physik, Gravitation und Relativitaetstheorie, Teilchenphysik, Theoretische und Mathematische Grundlagen der Physik der Deutschen Physikalischen Gesellschaft e.V. (DPG)
- Dates
- 3-7 Mar 2008
- Place
- Freiburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 40000607
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- CHARGE COLLECTION; EFFICIENCY; ELECTRODES; GEV RANGE 100-1000; INTEGRATED CIRCUITS; ION IMPLANTATION; PHYSICAL RADIATION EFFECTS; PION DETECTION; POSITION SENSITIVE DETECTORS; SI SEMICONDUCTOR DETECTORS; SILICON
- Descriptors DEC
- DETECTION; ELECTRONIC CIRCUITS; ELEMENTS; ENERGY RANGE; GEV RANGE; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; RADIATION DETECTION; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; SEMIMETALS
Optional Information
- Notes
- Session: T 56 Mi 17:30