Local atomic and electronic structure analysis of surfaces and thin films by photoelectron diffraction spectroscopy

Photoelectron and Auger electron diffractions from a localized core level provide information on atomic configurations. X-ray photoelectron and X-ray absorption spectroscopy are powerful analysis tools for the electronic and magnetic structures of surfaces. Taking advantage of the diffraction signals as an excellent element- and site-selective probe, diffraction spectroscopy enables direct access to the electronic and magnetic structures at subsurface region and disentanglement of the spectra from different atomic layers. We have applied this method to the investigation of the electronic and magnetic structures of Ni thin film at atomic level. (author)