Linear magnetoresistance and surface to bulk coupling in topological insulator thin films
- 1. Indian Institute of Science Education and Research Kolkata, Mohanpur-741246 (India)
- 2. Institute of Plasma Research, Bhat, Gandhinagar-382428 (India)
Description
We explore the temperature dependent magnetoresistance of bulk insulating topological insulator thin films. Thin films of Bi2Se2Te and BiSbTeSe1.6 were grown using the pulsed laser deposition technique and subjected to transport measurements. Magnetotransport measurements indicate a non-saturating linear magnetoresistance (LMR) behavior at high magnetic field values. We present a careful analysis to explain the origin of LMR taking into consideration all the existing models of LMR. Here we consider that the bulk insulating states and the metallic surface states constitute two parallel conduction channels. Invoking this, we were able to explain linear magnetoresistance behavior as a competition between these parallel channels. We observe that the cross-over field, where LMR sets in, decreases with increasing temperature. We propose that this cross-over field can be used phenomenologically to estimate the strength of surface to bulk coupling. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-648X/aa97baAdditional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 29
- Journal Issue
- 50
- Journal Page Range
- [6 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52046918
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COUPLING; ENERGY BEAM DEPOSITION; LASER RADIATION; MAGNETIC FIELDS; MAGNETORESISTANCE; PULSED IRRADIATION; SURFACES; TEMPERATURE DEPENDENCE; THIN FILMS; TOPOLOGY
- Descriptors DEC
- DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; FILMS; IRRADIATION; MATHEMATICS; PHYSICAL PROPERTIES; RADIATIONS; SURFACE COATING