Published June 1984
| Version v1
Journal article
Parametric effects on the liquid-film-thickness measurement by an ultrasonic method
Creators
- 1. Korea Advanced Inst. of Science and Technology, P.O. Box 150, Chongryangni, Seoul
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Trans. Am. Nucl. Soc.
- Journal Volume
- 46
- Series
- Trans. Am. Nucl. Soc.
- Journal Page Range
- 849-850
- ISSN
- 0003-018X
Conference
- Title
- Annual meeting of the American Nuclear Society.
- Dates
- 3-8 Jun 1984.
- Place
- New Orleans, LA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 16027152
- Subject category
- S22: GENERAL STUDIES OF NUCLEAR REACTORS; S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BUILDINGS; EQUATIONS; FILMS; IMPEDANCE; INTERFACES; LIQUIDS; MHZ RANGE 01-100; POLYACRYLATES; PULSE TECHNIQUES; SOUND WAVES; STAINLESS STEELS; THICKNESS; TRANSDUCERS; ULTRASONIC TESTING; ULTRASONIC WAVES; WATER
- Descriptors DEC
- ACOUSTIC TESTING; ALLOYS; CARBON ADDITIONS; DIMENSIONS; ESTERS; FLUIDS; FREQUENCY RANGE; HIGH ALLOY STEELS; HYDROGEN COMPOUNDS; IRON ALLOYS; IRON BASE ALLOYS; MATERIALS TESTING; MHZ RANGE; NONDESTRUCTIVE TESTING; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXYGEN COMPOUNDS; POLYMERS; POLYVINYLS; STEELS; TESTING
Optional Information
- Notes
- Published in summary form only.
- Secondary number(s)
- CONF-840614--.