Quantitative X-ray microanalysis of bulk and film tungsten oxide bronzes

The results of quantitative X-ray microanalysis of KxWO3 and NaxWO3 films of 50-200 nm thick are compared with the data of quantitative analysis of tungsten oxide bronzes by atomic absorption and atomic emission spectroscopy. It is shown that a unified approach to the X-ray microanalysis of the materials, based on the application of the method of ratios of measured relative intensities provides for a rather simple and reliable determination of bronze composition and estimation of film thickness. 4 refs., 2 figs