Published February 1993
| Version v1
Miscellaneous
Quantitative non-destructive layer-by-layer analysis of the surface sub-region of solids by Electron Probe Microanalysis
Creators
- 1. Technion-Israel Inst. of Tech., Haifa (Israel). Dept. of Materials Engineering
Description
Short communication
Additional details
Publishing Information
- Imprint Title
- Sixth Israel materials engineering conference IMEC VI
- Imprint Pagination
- 230 p.
- Journal Page Range
- (pt.p1) p. 33.
- Report number
- INIS-mf--13696
Conference
- Title
- 6. Israel materials engineering conference (IMEC VI).
- Dates
- 24-25 Feb 1993.
- Place
- Dead Sea (Israel).
INIS
- Country of Publication
- Israel
- Country of Input or Organization
- Israel
- INIS RN
- 24063218
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ELECTRON MICROPROBE ANALYSIS; PERFORMANCE; THIN FILMS; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; FILMS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS