Synthesis and phosphorescence properties of Mn4+, La3+ and Ho3+ in MgAl2Si2O8
- 1. Department of Chemistry, Faculty of Science, Erciyes University, Kayseri, 38039 (Turkey)
Description
Highlights: → The new red phosphors were synthesized in the MgAl2Si2O3 system. → These systems were characterizated with DTA/TG, XRD, SEM and PL. → The excitation and emission mechanisms were explained. - Abstract: Mn4+, La3+ and Ho3+ doped MgAl2Si2O8-based phosphors were first synthesized by solid state reaction. They were characterized by thermogravimetry (TG), differential thermal analysis (DTA), X-ray powder diffraction (XRD), photoluminescence (PL) and scanning electron microscopy (SEM). The phosphors were obtained at about 1300 deg. C. They showed broad red and fuchsia-pink emission bands in the range of 610-715 nm and had a different maximum intensity when activated by UV illumination. Such a fuchsia-pink emission can be attributed to the intrinsic d-d transitions of Mn4+.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2011.08.035Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2011.08.035;
- PII
- S0925-8388(11)01673-2;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 510
- Journal Issue
- 1
- Journal Page Range
- p. 6-10
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43048105
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIFFERENTIAL THERMAL ANALYSIS; DOPED MATERIALS; EXCITATION; HOLMIUM IONS; LANTHANUM IONS; MANGANESE IONS; PHOSPHORESCENCE; PHOSPHORS; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SOLIDS; SYNTHESIS; THERMAL GRAVIMETRIC ANALYSIS; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; ENERGY-LEVEL TRANSITIONS; GRAVIMETRIC ANALYSIS; IONS; LUMINESCENCE; MATERIALS; MICROSCOPY; PHOTON EMISSION; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; THERMAL ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.