Published 1977
| Version v1
Journal article
Immersion silicon spectrometric surface-barrier and Si(Li)-drifted detectors and possibilities of their use in analytical chemistry of transplutonium elements
Creators
Description
Results are presented concerning the use of spectrometric immersion-type detectors with time-stable parameters and multichannel measuring systems for the remote radiation monitoring applied to the processes of extraction separation and recovery of transplutonium elements (TPE). Processes involved in the manufacture of the detectors suitable for hostile environmental conditions are described. Spectra of the solutions containing α- or β-radiators (244Cm-252Cf-253Es) have been measured. Results are given of the remote measurements as compared with laboratory analysis data obtained by sampling and sample treatment. These results show promise for the practical utilization of the equipment developed
Additional details
Additional titles
- Original title (Russian)
- Погружные кремниевые спектрометрические поверхностно-барьерные и дрейфовые Си(Ли)-детекторы и возможности их применения в аналитической химии TPEh
Publishing Information
- Journal Title
- Radiokhimiya
- Journal Volume
- 19
- Journal Issue
- 4
- Series
- Radiokhimiya.
- Journal Page Range
- 450-454
Conference
- Title
- All-union conference on transplutonium elements chemistry (americium, curium, berkelium, californium).
- Dates
- 29 Jun - 1 Jul 1976.
- Place
- Dimitrovgrad, USSR.
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 9394470
- Subject category
- S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACTINIDE COMPLEXES; ALPHA SPECTROSCOPY; BETA SPECTROSCOPY; LI-DRIFTED SI DETECTORS; MONITORING; SOLUTIONS; SOLVENT EXTRACTION; SPECTRA; SPECTROMETERS; USES
- Descriptors DEC
- COMPLEXES; DISPERSIONS; HOMOGENEOUS MIXTURES; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MIXTURES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEPARATION PROCESSES; SI SEMICONDUCTOR DETECTORS; SPECTROSCOPY
Optional Information
- Notes
- 4 refs.; 4 figs.; 1 table; for English translation see the journal Sov. Radiochem.