Published February 2, 2007 | Version v1
Journal article

X-Ray Absorption Spectroscopy Study of Copper Doped ZnO Thin Films

  • 1. DND-CAT/Northwestern University, Advanced Photon Source, Argonne, IL 60439 (United States)
  • 2. Materials Science and Engineering, Northwestern University, Evanston, IL 60208 (United States)

Description

X-ray absorption spectroscopy technique is used to study copper-doped ZnO thin films, prepared by pulsed-laser deposition. The samples with various doping levels are examined. It is found that the samples contain metallic clusters with the sizes ≤ 2 nm as well as Cu1+ and Cu2+ states. The Cu1+ states exist as stable oxide clusters, while the Cu2+ ones participate in the ZnO lattice some of which may be pertaining to the surfaces of the Cu clusters as well. The copper clusters of ∼1 nm are unstable and fragment under monochromatic x-ray beam illumination

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
882
Journal Issue
1
Journal Page Range
p. 493-495
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
13. international conference on X-ray absorption fine structure
Acronym
XAFS13
Dates
9-14 Jul 2006
Place
Stanford, CA (United States)

Optional Information

Notes
(c) 2007 American Institute of Physics